Test Probes

The areas of application for our test probes are extremely wide-ranging. In the sectors of telecommunications, medical technology, aeronautics and aerospace, the automotive industry and many others, PTR HARTMANN test probes are used as secure and reliable contact elements for testing PCBs (ICT+FT) and cable harnesses.

One additional and steadily growing field of applications is the use of test probes as a charging contact (battery test probes, spring-loaded pogo pin-type contacts) for industrial applications or PCB connectors as a single contact or multi-pole contact block.

Test Probes for In-Circuit-Test (ICT)

PTR HARTMANN offers test probes for the in-circuit testing of centres from 40 to 100 mil (1.02 mm - 2.54 mm) with aggressive tip styles and contact pressures up to 4.0 N.

Our HPL series (high pre-load) with greatly increased pre-loading is ideal for penetrating oxidation and thick residues.

Rotating test probes and some versions for flying probe testers complete this range.

Standard Test Probes 30 mil - 177 mil (0.76 mm - 4.50 mm)

We offer test probes of 30 mil (0.76 mm) and higher for contacting in small centres. These can be supplied with a pre-wired receptacle.

Additional sizes of 50 mil (1.27 mm) and higher up to stable sizes 177 mil (4.50 mm) are available for a very wide range of electrical contacting processes in test adapter construction.

Test Probes for Cable Harness Test

A comprehensive selection of test probes is available for testing cable harnesses.

• Test probes with threads providing centres from 40 mil to160 mil (1.02 mm to 4.00 mm)
• Step probes
• Switching test probes in a range of versions and sizes with an easy-replacement system
• Twist proof test probes with a spade-shaped head style
• Push-back test probe with high contact pressures for the push-back test

Coaxial | High Frequency Test Probes

PTR HARTMANN’s high-frequency test probes can be used for the contacting of various connectors (e.g. SMA, SMB, SMC, MCX). Impedance up to 50 Ohm and a frequency range up to 9 GHz.

Versions for FAKRA and Mini-FAKRA (connector and socket) complete our offer.

Pogo Pins | PCB Connectors

PTR HARTMANN offers Pogo Pins and PCB connectors (Spring-Loaded Connectors)  in a single version or a compact block design.

The test probes are available for centres from 100 mil to 256 mil (2.54 mm to 6.50 mm), some with a solder connection.

Spring-Loaded Connectors are for use with SMT, THT applications and can contact the PCBs in vertical or horizontal alignment as a single contact or an spring-loaded connector. Contact blocks in SMT are designed for 50 mil (1.27 mm) applications.

Special designs are possible on request.

High-Current Test Probes

PTR HARTMANN's high-current test probes are designed for use in centres of 100 mil to 300 mil (2.54 mm to 7.60 mm).

The design of the high-current test probes allows of the probe tips, depending on the series, with rated currents from 16 A to 400 A. For secure, safe use in the test equipment, as an alternative all the series are also available as a threaded version.

A comprehensive range of tip styles and contact pressures allows use in the most varied applications.

Pneumatic Test Probes

Pneumatc test probes are used specifically in the function test (FT) for the separate triggering of measuring points.

PTR HARTMANN offers various designs and different tip styles for this purpose. Test probes with the easy-replacement system continue to be available.

Fixture Customizing

As a specialist in turned parts, PTR HARTMANN also offers special types for the manufacture of individual interfaces or also counter-contacts for battery applications.

A Marker Probe is available for marking PCBs or similar as correct or defective. This Probe can automatically and extremely quickly mark the required PCBs with a small circle, which ensures that defective parts can be quickly recognized and sorted out.

The Testjet pin is a special pin which is used in adapter development specifically to test HP Testjets or Teradyne Frame Scan applications. The main function of this Test Probe is to keep the pressure on the Testjet sensor plates as low as possible. The springs of the pin adapt the position of the sensor plate to the test piece, which prevents any possible twisting of the plate.