4082
ICT-Test Probe 50 mil / 1.27 mm
0
- International standard for 50 mil applications
- Robust and compact design
- Contacting of assembled PCBs
| Mechanical Data | | |
| Center | 1.27 mm /50 mil |
| Full travel | 6.40 mm |
| Working travel | 4.30 mm |
| Pre-loaded spring force | 0.40/ 0.50 N |
| Spring force at working travel | 1.50/ 2.00 N |
| Temperature range | -30 °C - +120 °C |
| Electrical Data | | |
| Continuous current | 2.0...3.0 A |
| Typical continuity resistance | ≤ 20 mOhm |
| Materials | | |
| Barrel | Bronze, gold-plated |
| Plunger | CuBe, gold-plated | |
| Receptacle | Bronze, gold-plated |
| Wire AWG 30 (blue) | Copper, silver-plated, insulated |
| Receptacle Extraction Tool | | |
| Receptacle | Complete | Insertion |
| H 1008 | WHE 1200/08 | WHA 1200/008 |
Tip Style • Diameter • Plating
| 1008/E | .55 | - | AL14 | - | 2.0 N | - | Au | - | 1.18 | C |
| [1] | [2] | | [3] | | [4] | | [5] | | [6] | [7] |
- Series
- Variant
- Tip Style
- Spring Force
- Tip Plating
- Tip Diameter
- Ring Contact Material (only for CuBe)