4082
 ICT-Test Probe 50 mil / 1.27 mm
  0
      - International standard for 50 mil applications
 - Robust and compact design
 - Contacting of assembled PCBs
  
              |  Mechanical Data  |    |    |  
    |  Center  |  1.27 mm /50 mil |  
  |  Full travel  |  6.40 mm |  
  |  Working travel  |  4.30 mm |  
  |  Pre-loaded spring force  |  0.40/ 0.50 N |  
  |  Spring force at working travel  |  1.50/ 2.00 N |  
  |  Temperature range  |  -30 °C - +120 °C |  
  
        |  Electrical Data  |    |    |  
    |  Continuous current  |  2.0...3.0 A |  
  |  Typical continuity resistance  |   ≤ 20 mOhm |  
  
        |  Materials  |    |    |    
  |  Barrel  |  Bronze, gold-plated |  
   |  Plunger  |  CuBe, gold-plated |    |  
  |  Receptacle  |  Bronze, gold-plated |  
  | Wire AWG 30 (blue) |  Copper, silver-plated, insulated |  
  
     |  Receptacle Extraction Tool  |    |    |  
   |  Receptacle  |   Complete  |   Insertion  |  
   | H 1008 |  WHE 1200/08 |  WHA 1200/008 |  
  
              Tip Style • Diameter • Plating 
   
                                | 1008/E | .55 | - | AL14 | - | 2.0 N | - | Au | - | 1.18 | C |  
  | [1] | [2] |  | [3] |  | [4] |  | [5] |  | [6] | [7] |  
 
 -  Series
 -  Variant
 -  Tip Style
 -  Spring Force
 -  Tip Plating
 -  Tip Diameter
 -  Ring Contact Material (only for CuBe)